Exploring stochastic nature of X-ray pulses from X-ray Free Electron Laser

by Prof. Jakub Szlachetko (IFJ PAN)

Thursday 12 Nov 2020, 11:00 → 13:00 Europe/Warsaw

ZOOM

Abstract:
Stochastic X-ray pulses from X-ray Free Electron Laser were applied towards two-dimensional X-ray spectroscopy in a regime where the opacity and transparency properties of matter are subject to the incident intensity and photon energy. Effective utilization of the most intense and the shortest pulse durations available at XFELs has now become possible via a developed reconstruction methodology for imaging of electronic state configurations of atoms.
 

Szlachetko12lis2020.pdf